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2601B-PULSE

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System SourceMeter® 10 μsec Pulser/SMU Instrument


The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.

 

 

Achieve high pulse fidelity without manual pulse tuning

The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 μH, ensuring your pulse has no overshoot and ringing when outputting pulses from 10 μs up to 500 μs at any current level up to 10 amps. With pulse rise times < 1.7 μs, you can properly characterize your device or circuit under test.

  • Output 10 A @ 10 V with a 10 μs pulse width

  • Pulse rise time <1.7 μs to characterize with confidence

  • High fidelity pulse output without tuning at any current level
 

2601B-PULSE 10A rise time

 

 

Incorporates the functionality of a fast pulser and SMU in one instrument

2601B-PULSE Fast Pulser and SMU in one instrument

 

The 2601B-PULSE adds pulser functionality to the superior measurement integrity, synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.

  • Pulser 0.05% basic measure accuracy with 1 MS/s digitizing

  • SMU 100 nA low current range with 100 fA sensitivity

  • 1Rear panel BNC connections for quick cable setup

 

 

Embedded scripting and connectivity for unmatched production throughput

Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.

  • Eliminates time-consuming bus communications to and from the PC

  • Advanced data processing and flow control

  • Connect up to 32 TSP-Link nodes

  • Reconfigure easily as test requirements change
 

2601B-PULSE Embedded Scripting

  

Models

Model

Channels
Max Current Source/Measure Range
Max Voltage Source/Measure Range
Measurement Resolution (Current/Voltage) Power

2601B-PULSE

1 10 A
40 V
100 fA / 100 nV

Pulser: 100 W instantaneous
SMU: 200 W instantaneous

  

Applications

Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications

The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.

  • Programmable pulse current source up to 10 A and 10 µs pulse widths

  • Voltage and current measure resolution at 100 nV and 100 fA

  • Built-in TSP® processing capability reduces PC-instrument bus communication
Document Icon Application Note: How to generate 10μs pulse with 2601B-PULSE System SourceMeter Pulse SMU Instrument
Document Icon White Paper: New Current Pulser / SMU Eliminates Time Consuming Manual Timing when Outputting Pulses as Low as 10 µs
 

2601B-PULSE LIDAR Laser Diode Production Test

 

 

Simplified Pulsed/DC I/V Characterization of LEDs

2601B-PULSE Pulsed DC I-V LED Characterisation

 

The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.

  • Programmable current source up to 10 A and 10 µs pulse widths

  • Voltage and current measure resolution at 100 nV and 100 fA

  • 1 Megasample/second digitizers for fast source and measure data collection

  • Built-in TSP processing capability reduces PC-instrument bus communication

 

 

On Wafer Semiconductor Testing

Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.

  • Built-in TSP processing capability reduces PC-instrument bus communication

  • TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments

 

2601B-PULSE On-Wafer Semiconductor Testing

  

Software

Keithley KickStart Instrument Control Software. No Programming Required.

Keithley KickStart Instrument Control Software

 

Making measurements is easy with KickStart. Characterize your devices and materials quickly and easily without programming. Visualize real-time results in graphical and tabular format. Export data tables or graphs for quick reporting or additional analysis in Excel.

  • Create single or sweep pulse tests quickly

  • Generate linear, log, list, and dual sweeps of voltage and current source with simultaneous measurement

  • I-V characterization application to support up to 4 source measure unit (SMU) instruments
  • 1GPIB, USB, Ethernet connectivity on Windows OS
Document Icon Download a 60-Day Trial version of Keithley KickStart
Document Icon Keithley KickStart Data Sheet

 

 

Embedded scripting and connectivity for unmatched production throughput

Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.

  • Eliminates time-consuming bus communications to and from the PC

  • Advanced data processing and flow control

  • Connect up to 32 TSP-Link nodes

  • Reconfigure easily as test requirements change
Document Icon Download TSB Software
 

Keithley Test Script Builder