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Digital Sampling Oscilloscope
The Ultimate in Signal Fidelity for Challenging High-Speed Characterization Tests
With an industry-leading intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155Mb/sec to 100G.
Models in the Series
Model |
Analog Bandwidth |
Sample Rate |
Record Length |
Analog Channels |
DC - 80 GHz |
Up to 300 kS/s |
50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) |
Determined by the sampling modules used, up to 8 channels |
Overview
Features |
Benefits |
Electrical module signal measurement accuracy:
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<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec). |
Industry’s lowest system noise at all bandwidths:
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Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure. |
Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. |
High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. |
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. |
Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm. |
Superior acquisition throughput with up to 300 kS/s maximum sample rate. |
Reduced manufacturing or device characterization test-time by 4X with superior system throughput. |
Ability to place the samplers adjacent to the device under test (DUT). |
Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed. |
Independent calibrated channel de-skew. |
Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing. |